Q200285
Oct 13, 2015
White Paper |
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White Paper: PXI–Based Semiconductor Test Systems: Advanced Test Capabilities and Features
The next generation of PXI digital instrumentation offers the capabilities and test features normally only found in proprietary ATE semiconductor systems. This paper provides and overview of how new, advanced PXI digital subsystems can address semiconductor test solutions such as the TS-900, can now offer a broader range of test capabilities for digital, mixed-signal and RF test applications. Read more... |
